LTC2050/LTC2050HV
6
2050fc
ELECTRICAL CHARACTERISTICS (LTC2050HV) The l denotes the specications which apply over the full
operating temperature range, otherwise specications are at TA = 25°C. VS = ±5V unless otherwise noted. (Note 3)
PARAMETER
CONDITIONS
C, I SUFFIXES
H SUFFIX
UNITS
MIN
TYP
MAX
MIN
TYP
MAX
Input Offset Voltage
(Note 2)
±0.5
±3
±0.5
±3
μV
Average Input Offset Drift
(Note 2)
l
±0.03
±0.05
μV/°C
Long-Term Offset Drift
50
nV/√mo
Input Bias Current (Note 4)
l
±25
±125
±300
±25
±125
±4000
pA
Input Offset Current (Note 4)
l
±250
±500
±250
±1000
pA
Input Noise Voltage
RS = 100Ω, 0.01Hz to 10Hz
1.5
μVP-P
Common Mode Rejection Ratio
VCM = Vto (V+ – 1.3)
l
120
115
130
120
115
130
dB
Power Supply Rejection Ratio
VS = 2.7V to 11V
l
120
115
130
120
115
130
dB
Large-Signal Voltage Gain
RL = 10k
125
120
140
125
120
140
dB
Maximum Output Voltage Swing
RL = 2k to GND
RL = 10k to GND
l
±4.75
±4.90
±4.94
±4.98
±4.50
±4.85
±4.94
±4.98
V
Slew Rate
2
V/μs
Gain Bandwidth Product
3
MHz
Supply Current
VSHDN = VIH, No Load
VSHDN = VIL
l
1
1.5
25
1
1.6
25
mA
μA
Shutdown Pin Input Low Voltage (VIL)
l
V+ 0.5
V
Shutdown Pin Input High Voltage (VIH)
l
V+ – 0.5
V
Shutdown Pin Input Current
VSHDN = V
l
–3
–20
–3
–20
μA
Internal Sampling Frequency
7.5
kHz
Note 1: Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device
reliability and lifetime.
Note 2: These parameters are guaranteed by design. Thermocouple effects
preclude measurements of these voltage levels during automated testing.
Note 3: All versions of the LTC2050 are designed, characterized and
expected to meet the extended temperature limits of – 40°C and 125°C.
The LTC2050C/LTC2050HVC are guaranteed to meet the temperature limits
of 0°C and 70°C. The LTC2050I/LTC2050HVI are guaranteed to meet the
temperature limits of –40°C and 85°C. The LTC2050H/LTC2050HVH are
guaranteed to meet the temperature limits of –40°C and 125°C.
Note 4: The bias current measurement accuracy depends on the proximity
of the supply bypass capacitor to the device under test, especially at ±5V
supplies. Because of testing limitations on the placement of this bypass
capacitor, the bias current at ±5V supplies is guaranteed by design to meet
the data sheet limits, but tested to relaxed limits.
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